Circuit Inspection
| Inspection Condition | (+) Probe | (-) Probe | Specification | ||
|---|---|---|---|---|---|
| Connector | Terminal | Connector | Terminal | ||
|
ECM connector | 77 (P-CAN high) | Chassis ground | - | Figure 1 below |
| ECM connector | 60 (P-CAN low) | Chassis ground | - | ||
| Cluster connector | 32 (C-CAN high) | Chassis ground | - | Figure 2 below | |
| Cluster connector | 33 (C-CAN low) | Cluster connector | - | ||
|
ECM connector | 77 (P-CAN high) | ICU connector | 22 (P-CAN high) | Approx. below 1Ω |
| ECM connector | 60 (P-CAN low) | ICU connector | 23 (P-CAN low) | Approx. below 1Ω | |
| Cluster connector | 32 (C-CAN high) | ICU connector | 29 (C-CAN high) | Approx. below 1Ω | |
| Cluster connector | 33 (C-CAN low) | ICU connector | 30 (C-CAN low) | Approx. below 1Ω | |
Good
- Fault is intermittent caused by poor contact in the sensor's and/or ECM's connector or was repaired and ECM memory was not cleared. Thoroughly check connectors for looseness, poor connection, bending, corrosion, contamination, deterioration, or damage. Repair or replace as necessary and go to "VERIFICATION OF REPAIR " procedure.
No Good
- Repair as necessary and go to "VERIFICATION OF REPAIR " procedure.
- If no problems were found with the circuits or connectors, replace the cluster and go to "VERIFICATION OF REPAIR " procedure.